Changeset 2359


Ignore:
Timestamp:
Jul 14, 2011, 3:58:52 AM (4 years ago)
Author:
wmb
Message:

OLPC manufacturing tests - fixed mfg-test-dev to correctly pass in device-specifier arguments, thus fixing a bug that caused "test int:0" to fail when the SD card did not have a partition table.

File:
1 edited

Legend:

Unmodified
Added
Removed
  • cpu/x86/pc/olpc/via/mfgtest.fth

    r1975 r2359  
    3535: mfg-test-dev  ( $ -- )
    3636   restore-scroller
    37    ??cr  ." Testing " 2dup type cr
    38    locate-device  if  ." Can't find device node" cr  exit  then  ( phandle )
    39    " selftest" rot execute-phandle-method            ( return abort? )
    40    if
    41       ?dup  if
     37   ??cr  ." Testing " 2dup type cr                     ( $ )
     38   2dup locate-device  if                              ( $ )
     39      2drop ." Can't find device node" cr  exit        ( -- )
     40   else
     41      drop                                             ( $ )
     42   then                                                ( $ phandle )
     43   " selftest" execute-device-method  if               ( return-code )
     44      ?dup  if                                         ( return-code )
    4245         ??cr ." Selftest failed. Return code = " .d cr
    4346         mfg-color-red sq-border!
     
    4649         flush-keyboard
    4750         mfg-wait-return
    48       else
     51      else                                                   ( )
    4952         green-letters
    5053         ." Okay" cr
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